This paper presents a new method for analysis and management of data, which are obtained by measuring the magnetic field emission in the laptop neighborhood. Accordingly, the extremely low frequency magnetic field radiation emitted from laptop is considered. Laptops operate in normal condition or under stress condition. Measurement is performed on top and bottom measuring positions of laptops, fed by alternating current and battery. Results are analyzed and discussed based on standard safe limit. Then, magnetic field ranges are obtained from clustering of measuring positions by K-Medians algorithm for detection of high emission levels. A comparison between ranges in normal condition and ranges under stress condition is pursued by the confusion matrix, revealing that higher magnetic field ranges are obtained when laptop is under stress. Finally, investigation of the confusion matrix confirms the distribution of measuring positions from lower range to higher range from normal to stress condition.

Detecting of the extremely low frequency magnetic field ranges for laptop in normal operating condition or under stress

Amelio A.
2016-01-01

Abstract

This paper presents a new method for analysis and management of data, which are obtained by measuring the magnetic field emission in the laptop neighborhood. Accordingly, the extremely low frequency magnetic field radiation emitted from laptop is considered. Laptops operate in normal condition or under stress condition. Measurement is performed on top and bottom measuring positions of laptops, fed by alternating current and battery. Results are analyzed and discussed based on standard safe limit. Then, magnetic field ranges are obtained from clustering of measuring positions by K-Medians algorithm for detection of high emission levels. A comparison between ranges in normal condition and ranges under stress condition is pursued by the confusion matrix, revealing that higher magnetic field ranges are obtained when laptop is under stress. Finally, investigation of the confusion matrix confirms the distribution of measuring positions from lower range to higher range from normal to stress condition.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11564/770210
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